Conducted in terms: 2021/22L, 2022/23L, 2023/24L, 2024/25L

ISCED code: 0710

ECTS credits: 5

Language: English

Organized by: Faculty of Physics, Astronomy and Informatics

Methods for materials characterization 0800-MMC

. Introduction - Types, structure, properties of materials.

1. Types of materials:

a) semiconductors,
b) metals and alloys,
c) ceramics,
d) polymers,
e) dielectric and ferroelectric materials,
f) superconductors,
g) magnetic materials,
h) optical materials,

2. Structure and properties of materials:

a) crystal structure,
b) bonds in a solid,
c) ordering and non-ordering in matter,
d) phonons,
e) thermally activated processes, diagrams and phase transitions,
f) electrons in a solid: electrical and thermal properties,
g) optical properties of materials,
h) magnetic properties of materials,
i) mechanical properties of materials.

3. Synthesis and processing of materials:

a) basic information on the synthesis and processing of materials,
b) semiconductors,
c) metals and alloys,
d) ceramics and glass,
e) polymers and organic compounds.

II. Physical methods of material characterization.

1. Diffraction techniques:

a) X-ray diffraction,
b) low energy electron diffraction,
c) high energy electron diffraction,
d) neutronography.

2. Optical spectroscopy:

a) infrared, visible and ultraviolet spectroscopy,
b) ellipsometry,
c) Raman spectroscopy,
d) luminescence,
e) transmission, absorption, reflection,
f) nonlinear optical spectroscopy.

3. Electron microscopy and spectroscopy:

a) scanning electron microscopy,
b) transmission electron microscopy,
c) photoemission,
d) Auger spectroscopy.

4. Surface microscopy:

a) atomic force microscopy,
b) scanning tunnel microscopy.

5. Methods for analyzing the composition of the material:

a) atomic absorption and transmission spectrometry,
b) X-ray fluorescence analysis,
c) mass spectrometry.

6. Measurements of electrical properties:

a) bridge methods,
b) two- and four-contact method,
c) contactless methods,
d) method based on the Hall effect,
e) Peltier effect and thermal conductivity.

7. Measurements of magnetic properties:

a) Foner magnetometer,
b) R-VSM magnetometer,
c) Faraday magnetometer,
d) AC bridges.

8. Measurements of mechanical properties:

a) compression, stretching and twisting,
b) elastormetry.

Term 2021/22L:

Introduction - Types, structure, properties of materials.

1. Types of materials:

a) semiconductors,

b) metals and alloys,

c) ceramics,

d) polymers,

e) dielectric and ferroelectric materials,

f) superconductors,

g) magnetic materials,

h) optical materials,

2. Structure and properties of materials:

a) crystal structure,

b) bonds in a solid,

c) ordering and non-ordering in matter,

d) phonons,

e) thermally activated processes, diagrams and phase transitions,

f) electrons in a solid: electrical and thermal properties,

g) optical properties of materials,

h) magnetic properties of materials,

i) mechanical properties of materials.

3. Synthesis and processing of materials:

a) basic information on the synthesis and processing of materials,

b) semiconductors,

c) metals and alloys,

d) ceramics and glass,

e) polymers and organic compounds.

II. Physical methods of material characterization.

1. Diffraction techniques:

a) X-ray diffraction,

b) low energy electron diffraction,

c) high energy electron diffraction,

d) neutronography.

2. Optical spectroscopy:

a) infrared, visible and ultraviolet spectroscopy,

b) ellipsometry,

c) Raman spectroscopy,

d) luminescence,

e) transmission, absorption, reflection,

f) nonlinear optical spectroscopy.

3. Electron microscopy and spectroscopy:

a) scanning electron microscopy,

b) transmission electron microscopy,

c) photoemission,

d) Auger spectroscopy.

4. Surface microscopy:

a) atomic force microscopy,

b) scanning tunnel microscopy.

5. Methods for analyzing the composition of the material:

a) atomic absorption and transmission spectrometry,

b) X-ray fluorescence analysis,

c) mass spectrometry.

6. Measurements of electrical properties:

a) bridge methods,

b) two- and four-contact method,

c) contactless methods,

d) method based on the Hall effect,

e) Peltier effect and thermal conductivity.

7. Measurements of magnetic properties:

a) Foner magnetometer,

b) R-VSM magnetometer,

c) Faraday magnetometer,

d) AC bridges.

8. Measurements of mechanical properties:

a) compression, stretching and twisting,

Term 2022/23L:

Introduction - Types, structure, properties of materials.

1. Types of materials:

a) semiconductors,

b) metals and alloys,

c) ceramics,

d) polymers,

e) dielectric and ferroelectric materials,

f) superconductors,

g) magnetic materials,

h) optical materials,

2. Structure and properties of materials:

a) crystal structure,

b) bonds in a solid,

c) ordering and non-ordering in matter,

d) phonons,

e) thermally activated processes, diagrams and phase transitions,

f) electrons in a solid: electrical and thermal properties,

g) optical properties of materials,

h) magnetic properties of materials,

i) mechanical properties of materials.

3. Synthesis and processing of materials:

a) basic information on the synthesis and processing of materials,

b) semiconductors,

c) metals and alloys,

d) ceramics and glass,

e) polymers and organic compounds.

II. Physical methods of material characterization.

1. Diffraction techniques:

a) X-ray diffraction,

b) low energy electron diffraction,

c) high energy electron diffraction,

d) neutronography.

2. Optical spectroscopy:

a) infrared, visible and ultraviolet spectroscopy,

b) ellipsometry,

c) Raman spectroscopy,

d) luminescence,

e) transmission, absorption, reflection,

f) nonlinear optical spectroscopy.

3. Electron microscopy and spectroscopy:

a) scanning electron microscopy,

b) transmission electron microscopy,

c) photoemission,

d) Auger spectroscopy.

4. Surface microscopy:

a) atomic force microscopy,

b) scanning tunnel microscopy.

5. Methods for analyzing the composition of the material:

a) atomic absorption and transmission spectrometry,

b) X-ray fluorescence analysis,

c) mass spectrometry.

6. Measurements of electrical properties:

a) bridge methods,

b) two- and four-contact method,

c) contactless methods,

d) method based on the Hall effect,

e) Peltier effect and thermal conductivity.

7. Measurements of magnetic properties:

a) Foner magnetometer,

b) R-VSM magnetometer,

c) Faraday magnetometer,

d) AC bridges.

8. Measurements of mechanical properties:

a) compression, stretching and twisting,

Term 2023/24L:

Introduction - Types, structure, properties of materials.

1. Types of materials:

a) semiconductors,

b) metals and alloys,

c) ceramics,

d) polymers,

e) dielectric and ferroelectric materials,

f) superconductors,

g) magnetic materials,

h) optical materials,

2. Structure and properties of materials:

a) crystal structure,

b) bonds in a solid,

c) ordering and non-ordering in matter,

d) phonons,

e) thermally activated processes, diagrams and phase transitions,

f) electrons in a solid: electrical and thermal properties,

g) optical properties of materials,

h) magnetic properties of materials,

i) mechanical properties of materials.

3. Synthesis and processing of materials:

a) basic information on the synthesis and processing of materials,

b) semiconductors,

c) metals and alloys,

d) ceramics and glass,

e) polymers and organic compounds.

II. Physical methods of material characterization.

1. Diffraction techniques:

a) X-ray diffraction,

b) low energy electron diffraction,

c) high energy electron diffraction,

d) neutronography.

2. Optical spectroscopy:

a) infrared, visible and ultraviolet spectroscopy,

b) ellipsometry,

c) Raman spectroscopy,

d) luminescence,

e) transmission, absorption, reflection,

f) nonlinear optical spectroscopy.

3. Electron microscopy and spectroscopy:

a) scanning electron microscopy,

b) transmission electron microscopy,

c) photoemission,

d) Auger spectroscopy.

4. Surface microscopy:

a) atomic force microscopy,

b) scanning tunnel microscopy.

5. Methods for analyzing the composition of the material:

a) atomic absorption and transmission spectrometry,

b) X-ray fluorescence analysis,

c) mass spectrometry.

6. Measurements of electrical properties:

a) bridge methods,

b) two- and four-contact method,

c) contactless methods,

d) method based on the Hall effect,

e) Peltier effect and thermal conductivity.

7. Measurements of magnetic properties:

a) Foner magnetometer,

b) R-VSM magnetometer,

c) Faraday magnetometer,

d) AC bridges.

8. Measurements of mechanical properties:

a) compression, stretching and twisting,

Term 2024/25L:

Introduction - Types, structure, properties of materials.

1. Types of materials:

a) semiconductors,

b) metals and alloys,

c) ceramics,

d) polymers,

e) dielectric and ferroelectric materials,

f) superconductors,

g) magnetic materials,

h) optical materials,

2. Structure and properties of materials:

a) crystal structure,

b) bonds in a solid,

c) ordering and non-ordering in matter,

d) phonons,

e) thermally activated processes, diagrams and phase transitions,

f) electrons in a solid: electrical and thermal properties,

g) optical properties of materials,

h) magnetic properties of materials,

i) mechanical properties of materials.

3. Synthesis and processing of materials:

a) basic information on the synthesis and processing of materials,

b) semiconductors,

c) metals and alloys,

d) ceramics and glass,

e) polymers and organic compounds.

II. Physical methods of material characterization.

1. Diffraction techniques:

a) X-ray diffraction,

b) low energy electron diffraction,

c) high energy electron diffraction,

d) neutronography.

2. Optical spectroscopy:

a) infrared, visible and ultraviolet spectroscopy,

b) ellipsometry,

c) Raman spectroscopy,

d) luminescence,

e) transmission, absorption, reflection,

f) nonlinear optical spectroscopy.

3. Electron microscopy and spectroscopy:

a) scanning electron microscopy,

b) transmission electron microscopy,

c) photoemission,

d) Auger spectroscopy.

4. Surface microscopy:

a) atomic force microscopy,

b) scanning tunnel microscopy.

5. Methods for analyzing the composition of the material:

a) atomic absorption and transmission spectrometry,

b) X-ray fluorescence analysis,

c) mass spectrometry.

6. Measurements of electrical properties:

a) bridge methods,

b) two- and four-contact method,

c) contactless methods,

d) method based on the Hall effect,

e) Peltier effect and thermal conductivity.

7. Measurements of magnetic properties:

a) Foner magnetometer,

b) R-VSM magnetometer,

c) Faraday magnetometer,

d) AC bridges.

8. Measurements of mechanical properties:

a) compression, stretching and twisting,

Total student workload

- hours carried out with teachers: 60h - time spent on individual work needed to successfully complete the course: 40h - time required to prepare and participate in the assessment process: 30h - time required to complete mandatory internships: 0h

Learning outcomes - knowledge

K_W04 The student understands the role of experiment and computer simulation in the design process of engineering issues; is aware of the technical and technological limitations of the apparatus in modeling physical phenomena, technical and biological objects. K_W05 The student knows the mechanisms and methods of synthesis of basic materials, the division of materials based on their structural features and has knowledge in the field of relationships between molecular parameters and physical properties of materials. K_W06 The student knows the basic concepts of body structure solid, inorganic organic and nanomaterials, their synthesis and methods of their analysis. K_W09 The student knows the basic principles of characterization of materials by physical and chemical methods

Learning outcomes - skills

K_U01 can obtain information from literature, databases and other sources; is able to integrate the information obtained, interpret it, as well as draw conclusions and formulate and substantiate opinions K_U02 can use basic application software packages for the presentation of results and data analysis K_U03 has the ability to self-study, incl. to improve professional competence K_U04 has language skills in the fields of science and scientific disciplines relevant to the field of study being studied, in accordance with the requirements set out for level B2 of the European Language Training Description System K_U05 is able to develop documentation regarding the implementation of an engineering task and prepare a text containing a discussion of the results of this task K_U06 is able to prepare and present a short presentation devoted to the results of an engineering task using specialized terminology K_U07 is able to use in not fully predictable conditions known mathematical methods and models, as well as computer simulations to analyze and evaluate the operation of modeled systems

Learning outcomes - social competencies

K_K01 can critically assess knowledge and knows its limitations K_K02 can accurately formulate questions to deepen understanding of a given topic K_K03 has awareness and understanding of the social aspects of the practical application of acquired knowledge and skills and related responsibility K_K04 understands and appreciates the importance of legal aspects of research and intellectual honesty K_K05 is aware of the importance of and understands the non-technical aspects and effects of the engineer's activities, including its impact on the environment and the associated responsibility for decisions made

Teaching methods

Teaching methods for giving and seeking, self-education.

Expository teaching methods

- informative (conventional) lecture
- participatory lecture

Exploratory teaching methods

- biographical
- observation
- laboratory
- presentation of a paper

Prerequisites

1. Student knows the laws of physics, thermodynamics, geometric and wave optics as well as photometry, electricity and magnetism; can describe physical phenomena and processes. 2. The student knows the units of the SI system and elements of the theory of measurement uncertainty used in the analysis of experimental results. 3. Student knows the basic application software packages for data analysis and development. 4. Student knows the basic principles of occupational health and safety.

Course coordinators

Anna Zawadzka

Assessment criteria

The course consists of 30 hours of lecture and 30 hours of laboratory. As part of the lecture, individual measurement techniques will be discussed. Appropriate measuring equipment existing at the Institute of Physics of the Nicolaus Copernicus University and the course of experiments testing the properties of materials using them will also be presented.

After introductory familiarization with the subject, students will carry out their own research project based on their individual interests. Each student will make not less than three samples from the proposed different material classes to analyze their physical properties. The selection of measurement methods will depend on the selected material.

Assessment methods:
Written project - the study of the selected material. Teacher verifying the implementation of the task checks the implementation of the subject effects: W1, W2, W3, W10, U1, U2, U3, U6, K1, K2, K3, K4

The exam in the form of the oral answer. Subjects related to the project.

Practical placement

not applicable

Bibliography

P.E.J. Flewitt, R.K. Wild - „Physical Method for Materials Characterisation”,
C. Kittel „Introduction to Solid State Physics”;
D. Hata „Introduction To Vacuum Technology”
J Grym „Semiconductor Technologies”
M. Hollas „Modern Spectroscopy”
D. Mattox „Handbook of Physical Vapor Deposition Processing”
B. Van Zeghbroeck „Principles od semiconductor divice”

Additional information

Additional information (registration calendar, class conductors, localization and schedules of classes), might be available in the USOSweb system:

Description of 0800-MMC in USOSweb